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High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy

Received: 15 November 2014     Accepted: 19 November 2014     Published: 23 December 2014
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Abstract

Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.

Published in American Journal of Nano Research and Applications (Volume 2, Issue 6-1)

This article belongs to the Special Issue Advanced Functional Materials

DOI 10.11648/j.nano.s.2014020601.14
Page(s) 27-33
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2014. Published by Science Publishing Group

Keywords

Photoemission Electron Microscopy, PEEM, Carbon Nanotube, CNT, High Resolution Imaging, Contrast Mechanisms

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Cite This Article
  • APA Style

    Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, et al. (2014). High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. American Journal of Nano Research and Applications, 2(6-1), 27-33. https://doi.org/10.11648/j.nano.s.2014020601.14

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    ACS Style

    Andreas Neff; Olga Naumov; Timna-Josua Kühn; Nils Weber; Michael Merkel, et al. High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. Am. J. Nano Res. Appl. 2014, 2(6-1), 27-33. doi: 10.11648/j.nano.s.2014020601.14

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    AMA Style

    Andreas Neff, Olga Naumov, Timna-Josua Kühn, Nils Weber, Michael Merkel, et al. High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy. Am J Nano Res Appl. 2014;2(6-1):27-33. doi: 10.11648/j.nano.s.2014020601.14

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  • @article{10.11648/j.nano.s.2014020601.14,
      author = {Andreas Neff and Olga Naumov and Timna-Josua Kühn and Nils Weber and Michael Merkel and Bernd Abel and Aron Varga and Katrin R. Siefermann},
      title = {High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy},
      journal = {American Journal of Nano Research and Applications},
      volume = {2},
      number = {6-1},
      pages = {27-33},
      doi = {10.11648/j.nano.s.2014020601.14},
      url = {https://doi.org/10.11648/j.nano.s.2014020601.14},
      eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.nano.s.2014020601.14},
      abstract = {Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.},
     year = {2014}
    }
    

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  • TY  - JOUR
    T1  - High Resolution Imaging of a Multi-Walled Carbon Nanotube with Energy-Filtered Photoemission Electron Microscopy
    AU  - Andreas Neff
    AU  - Olga Naumov
    AU  - Timna-Josua Kühn
    AU  - Nils Weber
    AU  - Michael Merkel
    AU  - Bernd Abel
    AU  - Aron Varga
    AU  - Katrin R. Siefermann
    Y1  - 2014/12/23
    PY  - 2014
    N1  - https://doi.org/10.11648/j.nano.s.2014020601.14
    DO  - 10.11648/j.nano.s.2014020601.14
    T2  - American Journal of Nano Research and Applications
    JF  - American Journal of Nano Research and Applications
    JO  - American Journal of Nano Research and Applications
    SP  - 27
    EP  - 33
    PB  - Science Publishing Group
    SN  - 2575-3738
    UR  - https://doi.org/10.11648/j.nano.s.2014020601.14
    AB  - Photoemission electron microscopy (PEEM) is a powerful and well established tool in surface science. In recent years, PEEM has been increasingly applied to new terrain, such as imaging of complex nano-objects and functional molecular materials, as well as time-resolved experiments. When applying PEEM to such new terrain, information on the mechanisms causing contrast in the PEEM image is particularly valuable. Here, we present a PEEM study on a complex nano-object – an individual multi-walled carbon nanotube (CNT) – to shed light on the origin of PEEM contrast. The presented PEEM images of the nanotube are of unsurpassed resolution and feature intensity variations along the nanotube. Complementary scanning electron microscopy (SEM) and atomic force microscopy (AFM) measurements on the same nanotube reveal topography as the dominant cause for the contrast observed along the nanotube. Energy-filtered PEEM measurements demonstrate that the contrast between nanotube and substrate mainly originates from their different electronic structures. The measurements further demonstrate that energy-filtered PEEM has the potential to image electronic structure variations of complex nano-objects and materials on nanometer length scales.
    VL  - 2
    IS  - 6-1
    ER  - 

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Author Information
  • Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany

  • Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany

  • FOCUS GmbH, Neukirchner Strasse 2, 65510 Hünstetten, Germany

  • FOCUS GmbH, Neukirchner Strasse 2, 65510 Hünstetten, Germany

  • FOCUS GmbH, Neukirchner Strasse 2, 65510 Hünstetten, Germany

  • Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany

  • Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany

  • Leibniz Institute of Surface Modification (IOM), Chemical Department, Permoser Strasse 15, 04318 Leipzig, Germany

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